• DocumentCode
    1408982
  • Title

    A new technique for the stable incorporation of static field solutions in the FDTD method for the analysis of thin wires and narrow strips

  • Author

    Craddock, Ian J. ; Railton, Chris J.

  • Author_Institution
    Centre for Commun. Res., Bristol Univ., UK
  • Volume
    46
  • Issue
    8
  • fYear
    1998
  • fDate
    8/1/1998 12:00:00 AM
  • Firstpage
    1091
  • Lastpage
    1096
  • Abstract
    The behavior of the fields around many common objects (e.g., wires, slots, and strips) converges to known static solutions. Incorporation of this a priori knowledge of the fields into the finite-difference time-domain (FDTD) algorithm provides one method for obtaining a more efficient characterization of these structures. Various methods of achieving this have been attempted; however, most have resulted in unstable algorithms. Recent investigations into the stability of FDTD have yielded criteria for stability, and this contribution for the first time links these criteria to a general finite-element formulation of the method. It is shown that the finite-element formulation provides a means by which FDTD may be generalized to include whatever a priori knowledge of the field is available, without compromising stability. Example results are presented for extremely narrow microstrip lines and wires
  • Keywords
    Galerkin method; electromagnetic field theory; equivalent circuits; finite difference time-domain analysis; microstrip lines; numerical stability; stability criteria; transmission line theory; EM analysis; FDTD method; finite-difference time-domain algorithm; finite-element formulation; microstrip lines; narrow strips; static field solutions; structure characterization; thin wires; Circuit stability; Electromagnetic analysis; Finite difference methods; Finite element methods; Microstrip; Moment methods; Stability criteria; Strips; Time domain analysis; Wires;
  • fLanguage
    English
  • Journal_Title
    Microwave Theory and Techniques, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9480
  • Type

    jour

  • DOI
    10.1109/22.704951
  • Filename
    704951