Title :
A multipage cell architecture for high-speed programming multilevel NAND flash memories
Author :
Takeuchi, Ken ; Tanaka, Tomoharu ; Tanzawa, Toru
Author_Institution :
Microelectron. Eng. Lab., Toshiba Corp., Yokohama, Japan
fDate :
8/1/1998 12:00:00 AM
Abstract :
To realize low-cost, highly reliable, high-speed programming, and high-density multilevel flash memories, a multipage cell architecture has been proposed. This architecture enables both precise control of the Vth of a memory cell and fast programming without any area penalty. In the case of a four-level cell, a high programming speed of 236 μs/512 bytes or 2.2 Mbytes/s can be obtained, which is 2.3 times faster than the conventional method. A small die size can be achieved with the newly developed compact four-level column latch circuit. A preferential page select method has also been proposed so as to improve the data retention characteristics. The IC error rate can be decreased by as much as 33%, and a highly reliable operation can be realized
Keywords :
EPROM; NAND circuits; PLD programming; integrated circuit reliability; integrated memory circuits; memory architecture; 2.2 Mbyte/s; data retention characteristics; error rate reduction; four-level cell; four-level column latch circuit; high reliability; high-density memories; high-speed programming; highly reliable operation; low-cost memory; multilevel NAND flash memories; multipage cell architecture; preferential page select method; Circuits; Costs; Degradation; Energy consumption; Error analysis; Flash memory; Latches; Threshold voltage; Tunneling; Voltage control;
Journal_Title :
Solid-State Circuits, IEEE Journal of