DocumentCode
1409847
Title
Computer generation of reference maps
Author
Lee, G. M.
Author_Institution
McDonnell Aircraft Corp., St. Louis, Mo.
Issue
2
fYear
1967
fDate
3/1/1967 12:00:00 AM
Firstpage
370
Lastpage
373
Keywords
Aerospace testing; Autocorrelation; Automatic test pattern generation; Bandwidth; Digital filters; Electronic equipment testing; Layout; Sensor systems; System testing; Test pattern generators;
fLanguage
English
Journal_Title
Aerospace and Electronic Systems, IEEE Transactions on
Publisher
ieee
ISSN
0018-9251
Type
jour
DOI
10.1109/TAES.1967.5408765
Filename
5408765
Link To Document