DocumentCode :
14100
Title :
Performance Enhancement of Blue InGaN Light-Emitting Diodes With a GaN–AlGaN–GaN Last Barrier and Without an AlGaN Electron Blocking Layer
Author :
Liwen Cheng ; Shudong Wu
Author_Institution :
Inst. of Optoelectron. Technol., Yangzhou Univ., Yangzhou, China
Volume :
50
Issue :
4
fYear :
2014
fDate :
Apr-14
Firstpage :
261
Lastpage :
266
Abstract :
Blue InGaN light-emitting diodes with a GaN-AlGaN-GaN last barrier (GAGLB) and without an AlGaN electron blocking layer (EBL) are investigated numerically. When the conventional last GaN barrier is replaced by a GAGLB and the most commonly used AlGaN EBL is removed, the forward voltage is reduced from 3.39 to 2.98 V, and the efficiency droop is improved from 30.1% to 14.2%. Simulation results indicate that these improvements can be attributed to the effective barrier height increase for electron confinement and to hole injection efficiency enhancement due to tunneling effect in the GAGLB.
Keywords :
III-V semiconductors; aluminium compounds; gallium compounds; indium compounds; light emitting diodes; numerical analysis; tunnelling; wide band gap semiconductors; InGaN-GaN-AlGaN-GaN; blue light-emitting diodes; effective barrier height; electron blocking layer; electron confinement; hole injection efficiency; numerical simulation; tunneling effect; voltage 3.39 V to 2.98 V; Aluminum gallium nitride; Charge carrier processes; Electric potential; Gallium nitride; Light emitting diodes; Quantum well devices; Radiative recombination; InGaN; internal quantum efficiency; light-emitting diodes (LEDs); quantum wells (QWs);
fLanguage :
English
Journal_Title :
Quantum Electronics, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9197
Type :
jour
DOI :
10.1109/JQE.2014.2305451
Filename :
6750705
Link To Document :
بازگشت