DocumentCode :
1410053
Title :
Special issue on materials, processing and reliability of 3D interconnects
Volume :
58
Issue :
1
fYear :
2011
Firstpage :
276
Lastpage :
276
Abstract :
Provides notice of upcoming special issue(s) of interest to practitioners and researchers.
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/TED.2010.2090429
Filename :
5673447
Link To Document :
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