DocumentCode :
1410154
Title :
GaAs/AlGaAs inversion channel devices for an integrated opto-electronic technology
Author :
Taylor, Graham W. ; Crawford, D.L. ; Kiely, P.A. ; Sargood, S.K. ; Cooke, Patrick ; Izabelle, A. ; Chang, T.Y. ; Tell, B. ; Lebby, M.S. ; Brown-Goebeler, K. ; Simmons, Jay G.
Author_Institution :
AT&T Bell Lab., Holmdel, NJ
Volume :
35
Issue :
12
fYear :
1988
fDate :
12/1/1988 12:00:00 AM
Firstpage :
2446
Abstract :
Optoelectronic integrated circuits based on devices having an inversion channel (electrons) induced at a heterointerface by a charge sheet of donors placed at the heterointerface have been investigated. These devices include the HFET, a heterojunction analog to the MOSFET; the HFED, a three-terminal lateral photodetector; the BICFET, a bipolar transistor in which the inversion channel acts as an induced base to eliminate charge storage; and the DOES, a three- or four-terminal optical/electrical switching device. The intrinsic compatibility of these devices was demonstrated by fabricating a single device structure on a GaAs/AlGaAs MBE (molecular-beam epitaxy)-grown wafer. Devices were processed using a mesa technology with refractory gates, self-aligned ion implantation and high-temperature RTA (rapid thermal annealing) cycles. The measured characteristics of the devices, obtained without optimization of the material growth, the device structural design, or the fabrication, indicate that the inversion channel technology has a unique potential for optoelectronic integration
Keywords :
III-V semiconductors; aluminium compounds; gallium arsenide; integrated optoelectronics; monolithic integrated circuits; BICFET; DOES; GaAs-AlGaAs; HFED; HFET; III-V semiconductors; MBE grown wafer; bipolar transistor; charge sheet; donors; heterointerface; high-temperature RTA; induced base; integrated opto-electronic technology; inversion channel devices; mesa technology; molecular-beam epitaxy; optical/electrical switching device; optoelectronic integration; rapid thermal annealing; refractory gates; self-aligned ion implantation; three-terminal lateral photodetector; Bipolar transistors; Electrons; Gallium arsenide; HEMTs; Heterojunctions; MODFETs; MOSFET circuits; Molecular beam epitaxial growth; Optical refraction; Photodetectors;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/16.8871
Filename :
8871
Link To Document :
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