Title :
Thermal breakdown of solid dielectrics
Author_Institution :
Massachusetts Institute of Technology, Cambridge
Abstract :
The purpose of this paper is to correlate the work which has been done on thermal breakdown and to put it in a form in which it can be used by the electrical engineer in the calculation of breakdown voltage. Besides a treatment of the Fock theory, the paper includes the derivation of new formulas for breakdown of very thin and very thick samples and for internal temperature rise and current.
Keywords :
Capacitance; Dielectrics; Electric breakdown; Insulation; Resistance; Solids; Stress;
Journal_Title :
Electrical Engineering
DOI :
10.1109/EE.1931.6430367
