• DocumentCode
    1411182
  • Title

    Testing NASA´s 3D-stack MCM space flight computer

  • Author

    Sasidhar, Koppol ; Alkalai, Leon ; Chatterjee, Abhijit

  • Author_Institution
    Georgia Inst. of Technol., Atlanta, GA, USA
  • Volume
    15
  • Issue
    3
  • fYear
    1998
  • Firstpage
    44
  • Lastpage
    55
  • Abstract
    Advanced packaging technologies pose major testing challenges for complex designs. The authors present test strategies used in the space flight computer designed for NASA´s Deep Space-1 mission
  • Keywords
    aircraft computers; circuit testing; computer testing; multichip modules; packaging; 3D-stack MCM; Deep Space-1; packaging; space flight computer; test strategies; Built-in self-test; Circuit testing; Clocks; Integrated circuit interconnections; Logic testing; NASA; Packaging; Registers; Space technology; System testing;
  • fLanguage
    English
  • Journal_Title
    Design & Test of Computers, IEEE
  • Publisher
    ieee
  • ISSN
    0740-7475
  • Type

    jour

  • DOI
    10.1109/54.706032
  • Filename
    706032
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1411182