• DocumentCode
    1411199
  • Title

    Efficient Algorithms for Summarizing Graph Patterns

  • Author

    Li, Jianzhong ; Liu, Yong ; Gao, Hong

  • Author_Institution
    Sch. of Comput. Sci. & Technol., Harbin Inst. of Technol., Harbin, China
  • Volume
    23
  • Issue
    9
  • fYear
    2011
  • Firstpage
    1388
  • Lastpage
    1405
  • Abstract
    We investigate the problem of summarizing frequent subgraphs by a smaller set of representative patterns. We show that some special graph patterns, called δ-jump patterns in this paper, must be representative patterns. Based on the fact, we devise two algorithms, RP-FP and RP-GD, to mine a representative set that summarizes frequent subgraphs. RP-FP derives a representative set from frequent closed subgraphs, whereas RP-GD mines a representative set from graph databases directly. Three novel heuristic strategies, Last-Succeed-First-Check, Reverse-Path-Trace, and Nephew-Representative-Based-Cover, are proposed to further improve the efficiency of RP-GD. RP-FP can provide a tight ratio bound but has heavy computation cost. RP-GD cannot provide a ratio bound guarantee but is more efficient than RP-FP. We also make use of the similarity between sibling branches in the graph pattern space to devise another much more efficient algorithm, RP-Leap, for mining a representative set that can approximately summarize frequent subgraphs. Our extensive experiments on both real and synthetic data sets verify the summarization quality and efficiency of our algorithms. To further demonstrate the interestingness of representative patterns, we study an application of representative patterns to classification. We demonstrate that the classification accuracy achieved by representative pattern-based model is no less than that achieved by closed graph pattern-based model.
  • Keywords
    graph theory; pattern classification; graph database; graph pattern; pattern classification; synthetic data set; Algorithm design and analysis; Approximation algorithms; Context; Data mining; Itemsets; Testing; Data mining; graph mining; pattern summarization.;
  • fLanguage
    English
  • Journal_Title
    Knowledge and Data Engineering, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1041-4347
  • Type

    jour

  • DOI
    10.1109/TKDE.2010.249
  • Filename
    5674039