Title :
Pentium Pro processor design for test and debug
Author :
Carbine, Adrian ; Feltham, Derek
Author_Institution :
Intel Corp., Hillsboro, OR, USA
Abstract :
The need to quickly ramp a complex, high-performance microprocessor into high-volume manufacturing with low defect rates led this design team to a custom, low-area DFT approach and a manually written test methodology that targeted several fault models. Their approach effectively balanced testability needs with other design constraints, while enabling excellent time to market and test quality
Keywords :
computer debugging; computer testing; microprocessor chips; Pentium Pro; debug; high-performance microprocessor; processor design; test; testability; Central Processing Unit; Circuit testing; Costs; Design for testability; Manufacturing processes; Microprocessors; Power dissipation; Power generation economics; Process design; Production;
Journal_Title :
Design & Test of Computers, IEEE
