Title :
Testing the 500-MHz IBM S/390 microprocessor
Author :
Foote, Thomas G. ; Hoffman, Dale E. ; Huott, William V. ; Koprowski, Timothy J. ; Kusko, Mary P. ; Robbins, Bryan J.
Author_Institution :
IBM Corp., Poughkeepsie, NY, USA
Abstract :
The design-for-test framework of the 500-MHz CMOS central processor uses specific tests to ensure the highest reliability of components within a system. Some of the same test patterns are applied in chip manufacturing and system-level tests
Keywords :
IBM computers; computer testing; microprocessor chips; 500-MHz; IBM S/390 microprocessor; design-for-test; test patterns; Automatic testing; Built-in self-test; Clocks; Logic arrays; Logic testing; Microprocessors; Programmable logic arrays; Random access memory; Registers; System testing;
Journal_Title :
Design & Test of Computers, IEEE
