• DocumentCode
    1411236
  • Title

    Alpha 21164 manufacturing test development and coverage analysis

  • Author

    Stoucny, C.J. ; Davies, Richard ; Mckernan, Pamela ; Truong, Tuyen

  • Author_Institution
    Compaq Comput. Corp., Shrewsbury, MA, USA
  • Volume
    15
  • Issue
    3
  • fYear
    1998
  • Firstpage
    98
  • Lastpage
    104
  • Abstract
    To meet the challenge of creating test vectors for the Alpha 21164 microprocessor, Compaq´s engineers describe a test generation and grading scheme that solves time-to-market, quality and cost concerns
  • Keywords
    Compaq computers; computer testing; microprocessor chips; Alpha 21164 microprocessor; Compaq; cost; quality; test generation; test vectors; time-to-market; Automatic testing; Costs; Design engineering; Hardware; Logic functions; Logic testing; Manufacturing processes; Microprocessors; System testing; Timing;
  • fLanguage
    English
  • Journal_Title
    Design & Test of Computers, IEEE
  • Publisher
    ieee
  • ISSN
    0740-7475
  • Type

    jour

  • DOI
    10.1109/54.706040
  • Filename
    706040
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1411236