Title :
Alpha 21164 manufacturing test development and coverage analysis
Author :
Stoucny, C.J. ; Davies, Richard ; Mckernan, Pamela ; Truong, Tuyen
Author_Institution :
Compaq Comput. Corp., Shrewsbury, MA, USA
Abstract :
To meet the challenge of creating test vectors for the Alpha 21164 microprocessor, Compaq´s engineers describe a test generation and grading scheme that solves time-to-market, quality and cost concerns
Keywords :
Compaq computers; computer testing; microprocessor chips; Alpha 21164 microprocessor; Compaq; cost; quality; test generation; test vectors; time-to-market; Automatic testing; Costs; Design engineering; Hardware; Logic functions; Logic testing; Manufacturing processes; Microprocessors; System testing; Timing;
Journal_Title :
Design & Test of Computers, IEEE
