• DocumentCode
    1411243
  • Title

    Effective built-in self test for Booth multipliers

  • Author

    Gizopoulos, Dimitris ; Paschalis, Antonis ; Zorian, Yervant

  • Author_Institution
    Inst. of Inf. & Telecommun., NCSR Demokritos, Athens, Greece
  • Volume
    15
  • Issue
    3
  • fYear
    1998
  • Firstpage
    105
  • Lastpage
    111
  • Abstract
    Booth multipliers, widely used as embedded cores in general-purpose data path structures and specialized digital signal processors, pose serious testability problems. This generic BIST scheme does not require DFT modifications in the multiplier structure, guarantees fault coverage higher than 99%, and can be adopted by any module generator
  • Keywords
    built-in self test; multiplying circuits; Booth multipliers; built-in self test; data path structures; digital signal processors; embedded cores; module generator; multiplier structure; testability; Acceleration; Built-in self-test; Design for testability; Digital signal processors; Informatics; Signal generators; Telecommunication computing; Testing;
  • fLanguage
    English
  • Journal_Title
    Design & Test of Computers, IEEE
  • Publisher
    ieee
  • ISSN
    0740-7475
  • Type

    jour

  • DOI
    10.1109/54.706041
  • Filename
    706041
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1411243