• DocumentCode
    1411501
  • Title

    Ground Fault Location Testing of a Noise-Pattern-Based Approach on an Ungrounded DC System

  • Author

    Pan, Y. ; Steurer, M. ; Baldwin, T.L.

  • Author_Institution
    GE Global Res. Center, Niskayuna, NY, USA
  • Volume
    47
  • Issue
    2
  • fYear
    2011
  • Firstpage
    996
  • Lastpage
    1002
  • Abstract
    Finding the phase-to-ground faults in ungrounded distribution systems is very difficult and time consuming. In recent years, the advances in power electronics favor dc distribution, particularly for transportation systems such as ships. Therefore, this paper presents a fault location approach which is based on the pattern recognition of inherent high-frequency noise associated with the switching events of converters. This paper demonstrates the feasibility of the approach through a hardware laboratory test. Specifically, a low-voltage dc system, representative of the salient high-frequency behavior of a real zonal electrical distribution system for ships, was used. Closely matching the results obtained from a computer simulation model of the circuitry, the experimental test results show the ability of the approach to appropriately differentiate various fault locations in the laboratory environment. It is concluded that the approach is feasible and can be applied toward the development of an effective ground fault location system for converter-dominated dc systems.
  • Keywords
    fault location; power convertors; power distribution faults; switching convertors; computer simulation model; converter-dominated dc systems; ground fault location testing; noise-pattern-based approach; pattern recognition; phase-to-ground faults; power electronics; transportation systems; ungrounded dc system; ungrounded distribution systems; Converter; fault location; ground fault; hardware test; noise pattern; switching event;
  • fLanguage
    English
  • Journal_Title
    Industry Applications, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0093-9994
  • Type

    jour

  • DOI
    10.1109/TIA.2010.2101997
  • Filename
    5674084