Title :
Chaos theory and first-order ray tracing in ducts
Author_Institution :
DERA, Malvern, UK
fDate :
7/9/1998 12:00:00 AM
Abstract :
The author highlights the importance of chaos theory to high frequency electromagnetic scattering problems and provides a novel method for presenting first-order ray theory related to the compound deviation matrix. This is applied to straight ducts of general cross-section and the average rate of reduction of ray intensity is related to the Lyapunov exponent. This allows estimates to be formed on the maximum duct length and incidence angle over which deterministic predictions are possible
Keywords :
chaos; electromagnetic wave scattering; ray tracing; HF electromagnetic scattering problems; Lyapunov exponent; chaos theory; compound deviation matrix; deterministic predictions; first-order ray tracing; high frequency EM scattering problems; incidence angle; maximum duct length; ray intensity reduction rate; straight ducts;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19980979
