• DocumentCode
    1411606
  • Title

    Internal temperature distribution measurements in high power semiconductor lasers

  • Author

    O´Brien, P. ; O´Callaghan, J. ; McInerney, J.

  • Author_Institution
    Dept. of Phys., Nat. Univ. of Ireland, Cork, Ireland
  • Volume
    34
  • Issue
    14
  • fYear
    1998
  • fDate
    7/9/1998 12:00:00 AM
  • Firstpage
    1399
  • Lastpage
    1401
  • Abstract
    A novel technique to measure internal temperature distributions within high power semiconductor lasers with substrates transparent to the laser radiation is presented. The temperature resolution is better than 1°C with a spatial resolution of 1-2 μm. The results show highly non-uniform transverse temperature distributions and significant heating close to the facet at high output powers
  • Keywords
    laser variables measurement; semiconductor lasers; spectral methods of temperature measurement; temperature distribution; high output powers; high power semiconductor lasers; internal temperature distribution measurements; laser radiation transparent substrate; nonuniform transverse temperature distributions;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19981004
  • Filename
    706094
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1411606