DocumentCode :
1411672
Title :
A Doppler Radar for Measuring Irregularities in Rolled Sheet Material
Author :
Alexander, Frank G.
Author_Institution :
Applied Physics and Instrumentation Group, R & D Division, American Viscose Corporation, Marcus Hook, Pa.
Issue :
1
fYear :
1963
fDate :
5/1/1963 12:00:00 AM
Firstpage :
83
Lastpage :
84
Abstract :
This 9-Gc system used a microwave signal reflected from the surface of a rotating roll of paper or plastic film to detect irregularities in the outer layers of the rolled material. The microwave package comprised a klystron oscillator, silicon dector crystal, and flared wave-guide horn antenna. A standard laboratory oscilloscope was used as the ``receiver´´ and display system. Examples of materials tested were: kraft paper, cellophane, polypropylene and polyethylene film. The cellulosic materials absorbed more energy and gave weaker reflections than the polyolefins. The minimum detectable surface ``ripples´´ were 0.010 inch high. A simple radar of this sort is useful for the noncontacting monitoring of moving surfaces. It has been used to detect surface motion through heavy protective windows.
Keywords :
Crystalline materials; Doppler radar; Klystrons; Microwave antennas; Microwave oscillators; Packaging; Plastic films; Radar detection; Sheet materials; Silicon;
fLanguage :
English
Journal_Title :
Industrial Electronics [May 1963], IEEE Transactions on
Publisher :
ieee
ISSN :
0099-4553
Type :
jour
DOI :
10.1109/TIE.1963.5409079
Filename :
5409079
Link To Document :
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