DocumentCode :
1411777
Title :
Compact Expressions for Supply Noise Induced Period Jitter of Global Binary Clock Trees
Author :
Jang, Jinwook ; Franza, Olivier ; Burleson, Wayne
Author_Institution :
Electr. & Comput. Eng. Dept., Univ. of Massachusetts, Amherst, MA, USA
Volume :
20
Issue :
1
fYear :
2012
Firstpage :
66
Lastpage :
79
Abstract :
Period jitter plays a critical role in global clock distribution design, because it directly impacts the time available for logic operations between sequential elements. Moreover, time-varying supply noise injected in global clock drivers can worsen the timing margin of critical paths by modulating period jitter. In the planning stage of global clock distribution for a high-end microprocessor, it is very critical to differentiate and understand the impacts of different design parameters on period jitter. However, it is hard to achieve due to complex relationship among different independent/dependent design parameters: supply noise amplitude, supply noise frequency, clock driver size, physical structures of interconnects, number of clock stages, temperature, process corners, etc. In this paper, we propose sets of analytical expressions which accurately model the behavior of supply noise induced period jitter of global binary clock trees without losing the details of clock distribution design parameters. These accurate expressions and their derivation process are used to provide detailed insight into the relationships between period jitter of binary clock distribution and distribution design parameters with several examples. Also detailed design guidelines for binary clock trees are presented.
Keywords :
clocks; timing jitter; trees (electrical); analytical expressions; compact expressions; global binary clock trees; logic operations; supply noise induced period jitter; time varying supply noise; Clocks; Driver circuits; Integrated circuit modeling; Jitter; Noise; Power supplies; Propagation delay; Binary clock tree; clock data compensation; clock jitter; period jitter; worst case period jitter;
fLanguage :
English
Journal_Title :
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
1063-8210
Type :
jour
DOI :
10.1109/TVLSI.2010.2089706
Filename :
5674124
Link To Document :
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