• DocumentCode
    1411841
  • Title

    Reversed ROBDD circuits

  • Author

    Bystrov, A. ; Almaini, A.E.A.

  • Author_Institution
    Dept. of Electr. & Electron. Eng., Napier Univ., Edinburgh, UK
  • Volume
    34
  • Issue
    15
  • fYear
    1998
  • fDate
    7/23/1998 12:00:00 AM
  • Firstpage
    1447
  • Lastpage
    1449
  • Abstract
    A new class of logic circuits is proposed. Being derived from reduced ordered binary decision diagrams (ROBDD), these circuits inherit compactness and the ability to represent very large switching functions. The reversed signal propagation results in low dynamic power consumption, complete single stuck-at fault testability and fault security. Simulation results are presented
  • Keywords
    Boolean functions; design for testability; logic circuits; logic design; switching functions; binary decision diagrams; fault security; logic circuits; low dynamic power consumption; reduced ordered BDD circuits; reversed ROBDD circuits; reversed signal propagation; single stuck-at fault testability; switching functions;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19981070
  • Filename
    706209
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1411841