Title :
Reversed ROBDD circuits
Author :
Bystrov, A. ; Almaini, A.E.A.
Author_Institution :
Dept. of Electr. & Electron. Eng., Napier Univ., Edinburgh, UK
fDate :
7/23/1998 12:00:00 AM
Abstract :
A new class of logic circuits is proposed. Being derived from reduced ordered binary decision diagrams (ROBDD), these circuits inherit compactness and the ability to represent very large switching functions. The reversed signal propagation results in low dynamic power consumption, complete single stuck-at fault testability and fault security. Simulation results are presented
Keywords :
Boolean functions; design for testability; logic circuits; logic design; switching functions; binary decision diagrams; fault security; logic circuits; low dynamic power consumption; reduced ordered BDD circuits; reversed ROBDD circuits; reversed signal propagation; single stuck-at fault testability; switching functions;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19981070
