DocumentCode :
1411865
Title :
Accurate Characterization of Broadband Multiconductor Transmission Lines for High-Speed Digital Systems
Author :
Kim, Joong-Ho ; Oh, Dan ; Kim, Woopoung
Author_Institution :
Signal Integrity Eng., Rambus Inc., Los Altos, CA, USA
Volume :
33
Issue :
4
fYear :
2010
Firstpage :
857
Lastpage :
867
Abstract :
Accurate modeling of transmission lines becomes increasingly important in high-speed interconnect system design. However, it is rather difficult to obtain broadband transmission line models, in particular using frequency-domain measurements. This paper points out two potential accuracy issues. First, inaccurate DC values of the frequency-domain data cause a severe error in the time-domain simulations. Second, it is difficult to characterize the characteristic impedance over a wide frequency range due to the reflection caused by the port discontinuities. This paper proposes the combination of both time and frequency measurement data to mitigate the DC accuracy issue. For the characteristic impedance model, a new de-embedding technique is presented to mitigate the port discontinuity issue. Several numerical examples, such as MCM-L coplanar lines and package microstrip lines, are studied to validate the accuracy of the proposed method.
Keywords :
coplanar transmission lines; electric impedance; frequency-domain analysis; microstrip lines; multiconductor transmission lines; DC value; MCM-L coplanar lines; broadband multiconductor transmission line; characteristic impedance model; deembedding technique; frequency-domain measurement; high-speed digital system; high-speed interconnect system design; package microstrip lines; Broadband communication; Interconnected systems; Transmission lines; DC transmission line parameters; de-embedding technique for multiconductor transmission lines; generalized conversion formula from ${rm S}$-parameter to RLGC; vector network analyzer (VNA) and time-domain reflectometry (TDR) measurements;
fLanguage :
English
Journal_Title :
Advanced Packaging, IEEE Transactions on
Publisher :
ieee
ISSN :
1521-3323
Type :
jour
DOI :
10.1109/TADVP.2010.2050204
Filename :
5674143
Link To Document :
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