Title :
Silicon Photodiodes in Standard CMOS Technology
Author :
Chou, Fang-Ping ; Chen, Guan-Yu ; Wang, Ching-Wen ; Liu, Yu-Chang ; Huang, Wei-Kuo ; Hsin, Yue-Ming
Author_Institution :
Dept. of Electr. Eng., Nat. Central Univ., Jhongli, Taiwan
Abstract :
Silicon photodiodes (PDs) of 850-nm-wavelength, in standard 0.18-μm CMOS technology, are systematically presented and discussed in this study. A basic p-n PD can obtain high responsivity of 0.3 A/W and response of 1.6 GHz while biasing in the avalanche process. However, Si PDs from different CMOS foundries would result in different performance due to the different n-/p-well doping profile. A basic p-n PD with body contact can effectively remove the slow diffusion carrier in the Si substrate and demonstrate improved response. Both body contact and deep n-well design in an octagonal PD can improve the performance of basic p-n PD significantly. The response is improved to 8.7 GHz with 0.8 A/W before breakdown. The improvement is due to the block and elimination of slow diffusion carriers in the Si substrate. Finally, Si PD with built-in n-p-n bipolar junction transistor and edge-coupled PD are proposed to further improve responsivity and response.
Keywords :
CMOS integrated circuits; avalanche photodiodes; bipolar transistors; diffusion; doping profiles; elemental semiconductors; p-i-n photodiodes; silicon; Si; Si substrate; avalanche process; body contact; deep n-well design; diffusion carrier; doping profile; edge-coupled photodiodes; frequency 1.6 GHz; n-p-n bipolar junction transistor; p-n photodiodes; responsivity improvement; silicon photodiodes; size 0.18 mum; standard CMOS technology; wavelength 850 nm; Bandwidth; CMOS integrated circuits; CMOS technology; Current measurement; Photoconductivity; Silicon; Substrates; Avalanche photodiodes; CMOS ICs; bipolar-CMOS (BiCMOD) IC; photodetectors; photodiodes (PDs);
Journal_Title :
Selected Topics in Quantum Electronics, IEEE Journal of
DOI :
10.1109/JSTQE.2010.2090343