• DocumentCode
    1412192
  • Title

    Migration and escape of barium atoms in a thermionic cathode

  • Author

    Jensen, Kevin L. ; Lau, Y.Y. ; Levush, Baruch

  • Author_Institution
    Naval Res. Lab., Washington, DC, USA
  • Volume
    28
  • Issue
    3
  • fYear
    2000
  • fDate
    6/1/2000 12:00:00 AM
  • Firstpage
    772
  • Lastpage
    781
  • Abstract
    A quantitative study of the physical processes on a thermionic cathode that are crucial to both cathode life and noise are investigated. Of particular interest are the transport of the barium atoms from the cathode interior to the cathode surface and beyond. To investigate these physical processes, a model of barium migration to the surface and its subsequent removal by bulk and monolayer evaporation and ion spattering is presented. This model incorporates material and tube environment parameters for the calculation of key terms governing diffusion, evaporation, and sputtering. Estimates of coverage, adsorbate work function values, lifetime, and current density are made, which are in qualitative agreement with the experiment. The model is based on a hopping model of barium diffusion to determine barium concentration within the cathode and the surface coverage ratio. Insofar as possible, all parameters are determined from simple models of the underlying physical processes.
  • Keywords
    barium; current density; diffusion; evaporation; monolayers; noise; sputtering; surface diffusion; surface phase transformations; thermionic cathodes; thermionic emission; work function; Ba; Ba atoms; Ba concentration; Ba diffusion; Ba migration; adsorbate work function values; bulk evaporation; cathode interior; cathode life; cathode noise; cathode surface; coverage; current density; diffusion; evaporation; hopping model; ion spattering; lifetime; material environment parameters; monolayer evaporation; physical processes; sputtering; surface coverage ratio; thermionic cathode; transport; tube environment parameters; Atomic layer deposition; Barium; Cathodes; Current density; Degradation; Fluctuations; Life estimation; Lifetime estimation; Sputtering; Temperature dependence;
  • fLanguage
    English
  • Journal_Title
    Plasma Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0093-3813
  • Type

    jour

  • DOI
    10.1109/27.887721
  • Filename
    887721