• DocumentCode
    1412204
  • Title

    Dynamic simulation of mode-selective interaction cavity for wide-band high-power gyrotron applications

  • Author

    Lin, A.T. ; Guo, H. ; Granatstein, Victor L.

  • Author_Institution
    Dept. of Phys., California Univ., Los Angeles, CA, USA
  • Volume
    28
  • Issue
    3
  • fYear
    2000
  • fDate
    6/1/2000 12:00:00 AM
  • Firstpage
    782
  • Lastpage
    789
  • Abstract
    A stretched particle-in-cell (PIC) code was used to carry out dynamic simulations of a mode-selective extended-interaction gyrotron oscillator. Simulation results show that using the same interaction length, increasing the number of coupled cavities tends to force the peak of the electric-field profile closer to the output plane. As a result, the radiation becomes easier to leak out and the cavity Q is reduced. Using three coupled cavities (TE02/TE03/TE04) with 10.6-cm total interaction length, the cavity Q of 260% and 25% efficiency can be attained in a second harmonic (31 GHz) gyrotron oscillator. Using the proposed cavity as the output cavity of an inverted gyrotwystron, the bandwidth without resistive loading attains 0.6%.
  • Keywords
    Q-factor; cavity resonators; gyrotrons; harmonic generation; millimetre wave generation; millimetre wave oscillators; millimetre wave tubes; waveguide components; 10.6 cm; 25 percent; 260 percent; 34 GHz; bandwidth; cavity; cavity Q; coupled cavities; dynamic simulation; dynamic simulations; electric-field profile; interaction length; inverted gyrotwystron; mode-selective extended-interaction gyrotron oscillator; mode-selective interaction cavity; output cavity; output plane; radiation; resistive loading; second harmonic gyrotron oscillator; simulation results; stretched particle-in-cell code; total interaction length; wide-band high-power gyrotron applications; Bandwidth; Broadband amplifiers; Cyclotrons; Electromagnetic heating; Electrons; Gyrotrons; Microwave oscillators; Pulse amplifiers; Tellurium; Wideband;
  • fLanguage
    English
  • Journal_Title
    Plasma Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0093-3813
  • Type

    jour

  • DOI
    10.1109/27.887723
  • Filename
    887723