• DocumentCode
    1412251
  • Title

    Microwave production by a free-electron laser bunched beam driving a resonant cavity at 35 GHz

  • Author

    Lefevre, Thibaut ; Gardelle, Jacques ; Rullier, Jean-Luc ; Donohue, John T. ; Lidia, Steven M.

  • Author_Institution
    Centre d´´Etudes Sci. et Tech. d´´Aquitaine, CEA, Le Barp, France
  • Volume
    28
  • Issue
    3
  • fYear
    2000
  • fDate
    6/1/2000 12:00:00 AM
  • Firstpage
    812
  • Lastpage
    820
  • Abstract
    In the two-beam accelerator scheme, a high-current electron beam, bunched at the resonant frequency, traverses extraction cavities, where it generates power intended to drive accelerating cavities on the main beam. Here, we report on work performed to test some aspects of this scheme. We used a free-electron-laser (FEL) amplifier at 35 GHz to bunch a beam of electrons, which is then transported and focused into a resonant cavity. The results of earlier bunching experiments had demonstrated the capacity of the FEL supplied by an induction linac to generate an appropriate drive beam. A summary of this earlier work is presented along with measurements of power from the cavity. This constitutes the first observation of high-frequency power extraction using a FEL in this scheme.
  • Keywords
    electron beam focusing; free electron lasers; laser cavity resonators; microwave tubes; particle beam bunching; 35 GHz; accelerating cavities; drive beam; electron beam bunching; electron beam focusing; electron beam transport; extraction cavities; free electron laser amplifier; free-electron laser bunched beam; high-current electron beam; high-frequency power extraction; induction linac; microwave production; power generation; power measurement; resonant cavity; resonant frequency; two-beam accelerator scheme; Electron accelerators; Electron beams; Free electron lasers; High power microwave generation; Laser beams; Masers; Power generation; Production; Resonance; Resonant frequency;
  • fLanguage
    English
  • Journal_Title
    Plasma Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0093-3813
  • Type

    jour

  • DOI
    10.1109/27.887730
  • Filename
    887730