• DocumentCode
    141253
  • Title

    Topological changes of the effective connectivity during the working memory training

  • Author

    Yu Sun ; Taya, Fumihico ; Yu Chen ; Delgado Martinez, Ignacio ; Thakor, Nitish ; Bezerianos, Anastasios

  • Author_Institution
    SINAPSE, Nat. Univ. of Singapore, Singapore, Singapore
  • fYear
    2014
  • fDate
    26-30 Aug. 2014
  • Firstpage
    6242
  • Lastpage
    6245
  • Abstract
    Working memory (WM) refers to the retention of information over a short period of time. Accumulated evidence showed that training WM would lead to beneficial effects in untrained tasks, which could be attributed to the strengthening of the functional connections between brain regions through repeated training task. In this proof of concept investigation, we applied a graph theoretical approach to analyze the early changes of functional connectivity from two subjects undergoing a spatial n-back WM training task for three continuous days. A significant decreased clustering coefficient and normalized shortest path length was revealed, suggesting a reduced local efficiency with an increased global efficiency after WM training. Our findings thereby provide insightful implications for understanding the mechanisms of brain dynamics in cognitive training.
  • Keywords
    cognition; electroencephalography; graph theory; neurophysiology; pattern clustering; brain dynamics; brain regions; clustering coefficient; cognitive training; effective connectivity; functional connections; functional connectivity; global efficiency; graph theoretical approach; information retention; normalized shortest path length; reduced local efficiency; repeated training task; spatial n-back WM training task; topological changes; untrained tasks; working memory training; Complex networks; Electroencephalography; Graph theory; Organizations; Sun; Training;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Engineering in Medicine and Biology Society (EMBC), 2014 36th Annual International Conference of the IEEE
  • Conference_Location
    Chicago, IL
  • ISSN
    1557-170X
  • Type

    conf

  • DOI
    10.1109/EMBC.2014.6945055
  • Filename
    6945055