Title :
End domain states and magnetization reversal in submicron magnetic structures
Author :
Shi, Jing ; Zhu, T. ; Durlam, M. ; Chen, Eason ; Tehrani, S. ; Zheng, Y.F. ; Zhu, J.-G.
Author_Institution :
Motorola Phoenix Corp. Res. Labs., Tempe, AZ, USA
fDate :
7/1/1998 12:00:00 AM
Abstract :
Patterned submicron magnetic thin films of various geometries have been systematically studied. We have observed end domain states in rectangular elements, which is in excellent agreement with micromagnetic simulation results. Significant deviation from single domain behavior has been found in low aspect ratio elements. We will show that this deviation is attributed to behavior of the end domains
Keywords :
magnetic domains; magnetic thin films; magnetisation reversal; end domain states; end domains; low aspect ratio elements; magnetization reversal; micromagnetic simulation; patterned submicron magnetic thin films; rectangular elements; single domain behavior; submicron magnetic structures; Geometry; Laboratories; Magnetic domains; Magnetic films; Magnetic force microscopy; Magnetic switching; Magnetization reversal; Micromagnetics; Silicon; Solid modeling;
Journal_Title :
Magnetics, IEEE Transactions on
