DocumentCode
1412582
Title
End domain states and magnetization reversal in submicron magnetic structures
Author
Shi, Jing ; Zhu, T. ; Durlam, M. ; Chen, Eason ; Tehrani, S. ; Zheng, Y.F. ; Zhu, J.-G.
Author_Institution
Motorola Phoenix Corp. Res. Labs., Tempe, AZ, USA
Volume
34
Issue
4
fYear
1998
fDate
7/1/1998 12:00:00 AM
Firstpage
997
Lastpage
999
Abstract
Patterned submicron magnetic thin films of various geometries have been systematically studied. We have observed end domain states in rectangular elements, which is in excellent agreement with micromagnetic simulation results. Significant deviation from single domain behavior has been found in low aspect ratio elements. We will show that this deviation is attributed to behavior of the end domains
Keywords
magnetic domains; magnetic thin films; magnetisation reversal; end domain states; end domains; low aspect ratio elements; magnetization reversal; micromagnetic simulation; patterned submicron magnetic thin films; rectangular elements; single domain behavior; submicron magnetic structures; Geometry; Laboratories; Magnetic domains; Magnetic films; Magnetic force microscopy; Magnetic switching; Magnetization reversal; Micromagnetics; Silicon; Solid modeling;
fLanguage
English
Journal_Title
Magnetics, IEEE Transactions on
Publisher
ieee
ISSN
0018-9464
Type
jour
DOI
10.1109/20.706336
Filename
706336
Link To Document