• DocumentCode
    1412609
  • Title

    Magnetization reversal in nanostructured Co/Pt multilayer dots and films

  • Author

    Thielen, M. ; Kirsch, S. ; Weinforth, H. ; Carl, A. ; Wassermann, E.F.

  • Author_Institution
    Tieftemperaturphys., Gerhard-Mercator-Univ. GH Duisburg, Germany
  • Volume
    34
  • Issue
    4
  • fYear
    1998
  • fDate
    7/1/1998 12:00:00 AM
  • Firstpage
    1009
  • Lastpage
    1011
  • Abstract
    We report on the magnetic properties of large scale periodic magnetic nanostructures designed as dot-arrays with periodicity ranging between 300 nm and 1100 nm, consisting of Co/Pt multilayer dots with respective diameters ranging between 230 nm and 740 nm. The nanostructures are fabricated by using optical interference lithography allowing for large area (cm2) fabrication. The Co/Pt multilayer dots show a pronounced out-of-plane magnetic anisotropy. The magnetic properties are determined from magneto-optical Kerr effect measurements in polar geometry and results are compared to respective continuous Co/Pt multilayer thin films. The micromagnetic properties of both, films and nanostructures are investigated with magnetic force microscopy allowing for the application of an external perpendicular magnetic field of up to B=0.15 T
  • Keywords
    Kerr magneto-optical effect; cobalt; ferromagnetic materials; magnetic anisotropy; magnetic force microscopy; magnetic multilayers; magnetic thin films; magnetisation reversal; nanostructured materials; photolithography; platinum; 300 to 1100 nm; Co-Pt; Co/Pt multilayer dots; dot-arrays; external perpendicular magnetic field; films; large area fabrication; large scale periodic magnetic nanostructures; magnetic force microscopy; magnetic properties; magnetization reversal; magneto-optical Kerr effect; micromagnetic properties; nanostructured Co/Pt multilayer dots; nanostructures; optical interference lithography; out-of-plane magnetic anisotropy; periodicity; polar geometry; Geometrical optics; Large-scale systems; Magnetic anisotropy; Magnetic field measurement; Magnetic films; Magnetic multilayers; Magnetic properties; Magnetization reversal; Nanostructures; Perpendicular magnetic anisotropy;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/20.706340
  • Filename
    706340