DocumentCode :
1412732
Title :
Characteristics of AP bias in spin valve memory elements
Author :
Zhu, Jian-Gang ; Zheng, Youfeng
Author_Institution :
Dept. of Electr. & Comput. Eng., Carnegie Mellon Univ., Pittsburgh, PA, USA
Volume :
34
Issue :
4
fYear :
1998
fDate :
7/1/1998 12:00:00 AM
Firstpage :
1063
Lastpage :
1065
Abstract :
Spin valve memory element biased with a pair of antiparallel (AP) coupled ferromagnetic layer was analyzed and modeled via micromagnetic simulation. In an AP structure, an external field results in a torque, causing the antiparallel magnetization (AP) axis to rotate towards the direction orthogonal to the field. In addition, due to its strength difference between the two AP layers, the magnetostatic field from the free layer of the spin valve can lead to irreversible AP axis flipping. This irreversible flipping can be effectively prevented by applying an AF/F exchange pinning to one of the AP layers to overcome the differential field from the free layer
Keywords :
giant magnetoresistance; magnetoresistive devices; antiparallel coupled ferromagnetic layer; exchange pinning; magnetostatic field; spin valve memory elements; strength difference; Antiferromagnetic materials; Couplings; Decision support systems; Magnetic analysis; Magnetic flux; Magnetic separation; Magnetization; Magnetostatics; Micromagnetics; Spin valves;
fLanguage :
English
Journal_Title :
Magnetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9464
Type :
jour
DOI :
10.1109/20.706357
Filename :
706357
Link To Document :
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