DocumentCode
1412815
Title
Magnetization switching behavior in nanostructured NiFe/Co/Cu/Co spin-valve
Author
Asada, H. ; Matsuyama, K. ; Hosokawa, Y. ; Taniguchi, K.
Author_Institution
Dept. of Electron. Device Eng., Kyushu Univ., Fukuoka, Japan
Volume
34
Issue
4
fYear
1998
fDate
7/1/1998 12:00:00 AM
Firstpage
1102
Lastpage
1104
Abstract
The evaporated NiFe/Co/Cu/Co spin-valve strips to the 0.2 μm width were successfully fabricated by Ar ion-milling through the negative type resist mask exposed by electron beam lithography, which is a simple fabrication method free from the deposition process limitation and multilayer materials. The size effect on the magnetization switching behavior was investigated by measuring the magnetoresistance (MR) change in the nanostructured strips with various widths on the same glass substrate. The Barkhausen like jump, which suggests the irreversible switching of the micro-domain, was observed in the 0.3 μm strip in the MR hysteresis. A quite different switching behavior was observed in the 0.2 μm width strip, which presented drastically steep switching within 5 Oe in both magnetic layers and demonstrated the well defined quantization of the magnetization direction along the longitudinal direction
Keywords
Barkhausen effect; cobalt; copper; electron beam lithography; ferromagnetic materials; iron alloys; magnetic domains; magnetic multilayers; magnetic switching; magnetisation; magnetoresistance; masks; metallic superlattices; nickel alloys; Ar ion-milling; Barkhausen like jump; NiFe-Co-Cu-Co; electron beam lithography; fabrication method; glass substrate; irreversible switching; magnetization direction; magnetization switching behavior; magnetoresistance; micro-domain; nanostructured NiFe/Co/Cu/Co spin-valve; nanostructured strips; negative type resist mask; quantization; size effect; Argon; Electron beams; Fabrication; Lithography; Magnetic materials; Magnetic multilayers; Magnetic switching; Magnetization; Resists; Strips;
fLanguage
English
Journal_Title
Magnetics, IEEE Transactions on
Publisher
ieee
ISSN
0018-9464
Type
jour
DOI
10.1109/20.706378
Filename
706378
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