DocumentCode :
1413050
Title :
Magnetic anisotropy and its microstructural origin in epitaxially grown SmCo thin films
Author :
Benaissa, Mohamed ; Krishnan, Kannan M. ; Fullerton, Eric E. ; Jiang, J.S.
Author_Institution :
Nat. Center for Electron Microscopy, Lawrence Berkeley Lab., CA, USA
Volume :
34
Issue :
4
fYear :
1998
fDate :
7/1/1998 12:00:00 AM
Firstpage :
1204
Lastpage :
1206
Abstract :
Microstructural features and magnetic behavior of epitaxially grown SmCo thin films with very high in-plane anisotropy are presented. Transmission electron microscopy was used to characterize the microstructure while magnetic measurements were performed using dc and SQUID magnetometers. Two substrate orientations were studied, i.e., MgO(100)/Cr(100)/SmCo(112¯0) and MgO(110)/Cr(211)/smCo(11¯00). In the former, the SmCo(112¯0) film shows a bicrystalline microstructure, whereas in the latter, a uniaxial one is observed. Both microstructures consist of grains with a mixture of SmCo3, Sm 2Co7 and SmCo5 polytypoids. A deviation from the c-axes was observed in the in-plane anisotropy of the SmCo(112¯0) thin film. A strong exchange interaction between the grains would, in principle, explain the observed deviation, On the other hand, both SmCo(112¯0) and (11¯00) thin films show very high coercivity values with pinning-type characteristics. Possible coercivity mechanisms related to intergranular exchange interactions and local variation in magnetocrystalline anisotropy constants are discussed
Keywords :
chromium; cobalt alloys; coercive force; crystal microstructure; exchange interactions (electron); ferromagnetic materials; magnesium compounds; magnetic anisotropy; magnetic epitaxial layers; samarium alloys; transmission electron microscopy; MgO(100)/Cr(100)/SmCo(112¯0); MgO(110)/Cr(211)/smCo(11¯00); MgO-Cr-SmCo; epitaxially grown SmCo thin films; in-plane anisotropy; intergranular exchange interactions; local variation; magnetic anisotropy; microstructural origin; pinning-type characteristics; strong exchange interaction; transmission electron microscopy; very high coercivity values; Anisotropic magnetoresistance; Coercive force; Electrons; Elementary particle exchange interactions; Magnetic anisotropy; Magnetic films; Magnetic force microscopy; Microstructure; Perpendicular magnetic anisotropy; Transistors;
fLanguage :
English
Journal_Title :
Magnetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9464
Type :
jour
DOI :
10.1109/20.706494
Filename :
706494
Link To Document :
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