DocumentCode :
1413062
Title :
Spin-reorientation transitions in ultrathin ferromagnetic films under applied field
Author :
Millev, Y.T. ; Oepen, H.P. ; Kirschner, J.
Author_Institution :
Max-Planck-Inst. of Math. in the Sci., Leipzig, Germany
Volume :
34
Issue :
4
fYear :
1998
fDate :
7/1/1998 12:00:00 AM
Firstpage :
1210
Lastpage :
1212
Abstract :
The influence of external field on thin ferromagnetic films with spin-reorientation transitions (SRTs) is explored in the presence of different orders of thickness-dependent uniaxial anisotropy. The two principal configurations are addressed and the first two anisotropy contributions are examined. A simple and natural representation of the field-induced SRTs has been found. It preserves the linearity of the thickness-driven trajectories even with field. The crosspoints of these trajectories with the phase borderlines correspond to crossover thicknesses of a linear type for positive second-order anisotropy contributions and of both linear and nonlinear types for negative second-order anisotropies. In the latter case, the nonlinear boundaries correlate with the coexistence of phases which brings about first-order-like reorientations and concomitant hysteresis effects. Practical schemes are proposed for the determination of the complete set of anisotropy parameters from measured field dependences of the crossover thicknesses
Keywords :
ferromagnetic materials; magnetic anisotropy; magnetic hysteresis; magnetic thin films; spin dynamics; anisotropy parameters; applied field; hysteresis effects; negative second-order anisotropies; positive second-order anisotropy contributions; spin-reorientation transitions; thickness-dependent uniaxial anisotropy; thickness-driven trajectories; ultrathin ferromagnetic films; Anisotropic magnetoresistance; Ear; Linearity; Magnetic analysis; Magnetic hysteresis; Magnetization; Mathematics; Microstructure; Physics; Temperature;
fLanguage :
English
Journal_Title :
Magnetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9464
Type :
jour
DOI :
10.1109/20.706498
Filename :
706498
Link To Document :
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