• DocumentCode
    1413502
  • Title

    A neural-learning-based reflectance model for 3-D shape reconstruction

  • Author

    Cho, Siu-Yeung ; Chow, Tommy W S

  • Author_Institution
    Dept. of Electron. Eng., City Univ. of Hong Kong, Kowloon, China
  • Volume
    47
  • Issue
    6
  • fYear
    2000
  • fDate
    12/1/2000 12:00:00 AM
  • Firstpage
    1346
  • Lastpage
    1350
  • Abstract
    In this letter, the limitation of the conventional Lambertian reflectance model is addressed and a new neural-based reflectance model is proposed of which the physical parameters of the reflectivity under different lighting conditions are interpreted by the neural network behavior of the nonlinear input-output mapping. The idea of this method is to optimize a proper reflectance model by a neural learning algorithm and to recover the object surface by a simple shape-from-shading (SFS) variational method with this neural-based model. A unified computational scheme is proposed to yield the best SFS solution. This SFS technique has become more robust for most objects, even when the lighting conditions are uncertain.
  • Keywords
    image reconstruction; learning (artificial intelligence); light reflection; neural nets; reflectivity; 3-D shape reconstruction; Lambertian reflectance model limitation; lighting conditions; neural-learning-based reflectance model; nonlinear input-output mapping; object surface recovery; reflectivity; shape-from-shading variational method; unified computational scheme; Computer vision; Image reconstruction; Light sources; Manufacturing industries; Neural networks; Optimization methods; Reflectivity; Robustness; Shape; Surface reconstruction;
  • fLanguage
    English
  • Journal_Title
    Industrial Electronics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0278-0046
  • Type

    jour

  • DOI
    10.1109/41.887964
  • Filename
    887964