Title :
Cr-Ta2O5 seedlayer for recording media on alternative substrates
Author :
Xiong, Wei ; Hoo, Hung-Lee
Author_Institution :
Mater. Res. Corp., Orangeburg, NY, USA
fDate :
7/1/1998 12:00:00 AM
Abstract :
Cr-Ta2O5 pre-coat significantly improved the coercivity and recording performance of CoCrPtTa/Cr films on glass-ceramic substrate. X-ray diffraction patterns showed enhanced Cr (110) and in-plane Co (100) textures due to Cr-Ta2O5 pre-coat. X-ray photoelectron spectroscopy indicated the existence of Ta2O5 in Cr-Ta2O5 film. Unlike the pure Cr, Cr-Ta2O5 film on glass-ceramic substrate displayed very fine and uniform grain structure. This might be due to the less mobile Ta2O5 oxides that prevent high-mobility Cr atoms from migration to form large grains. The impact of pre-coat thickness and sputter conditions on media magnetic properties was also investigated
Keywords :
X-ray diffraction; X-ray photoelectron spectra; binding energy; cermets; chromium; chromium alloys; cobalt alloys; coercive force; ferromagnetic materials; grain size; magnetic recording noise; magnetic thin films; platinum alloys; sputter deposition; sputtered coatings; surface texture; tantalum alloys; tantalum compounds; (100) textures; (110) textures; CoCrPtTa-Cr; CoCrPtTa/Cr films; Cr underlayer; Cr-Ta2O5; Cr-Ta2O5 seedlayer; CrTa2O5; SEM; Ta2O5; X-ray diffraction patterns; X-ray photoelectron spectra; alternative substrates; binding energy; coercivity; fine uniform grain structure; glass-ceramic substrate; grain size control; magnetic recording media; media magnetic properties; microstructure; precoat thickness; recording performance; sputter conditions; Chromium alloys; Coercive force; Glass; Magnetic films; Magnetic materials; Magnetic properties; Spectroscopy; Sputtering; Substrates; X-ray diffraction;
Journal_Title :
Magnetics, IEEE Transactions on
