Title :
The dependence of media noise on the magnetic cluster size for Co based thin film media fabricated under ultra clean sputtering process
Author :
Takahashi, M. ; Kikuchi, A. ; Hara, H. ; Shoji, H.
Author_Institution :
Dept. of Electron. Eng., Tohoku Univ., Sendai, Japan
fDate :
7/1/1998 12:00:00 AM
Abstract :
The media noise performance is discussed quantitatively in connection with magnetic microstructure for Co based thin film media fabricated under Ultra Clean (UC) process. Results are summarized as follows: (1) The media noise decreases by reducing the dispersion of magnetic field strength at transition, (2) The dispersion of magnetic field strength at transition is suppressed by the reduction of magnetic cluster size, and (3) The grain size reduction and the decrement of intergranular magnetic coupling play an important role for the improvement of recording performance though the reduction of magnetic cluster size
Keywords :
chromium alloys; cobalt alloys; ferromagnetic materials; grain size; magnetic force microscopy; magnetic recording noise; magnetic thin films; nickel alloys; sputter deposition; sputtered coatings; tantalum alloys; Co based thin film media; CoCrTa; CoNiCr; Cr film underlayers; MFM images; bit transitions; dispersion of magnetic field strength; grain size reduction; intergranular magnetic coupling; magnetic cluster size; magnetic microstructure; media noise performance; ultra clean sputtering process; Couplings; Dry etching; Grain size; Magnetic films; Magnetic force microscopy; Magnetic noise; Magnetic recording; Noise reduction; Sputtering; Substrates;
Journal_Title :
Magnetics, IEEE Transactions on
