Title :
Thermal stability of ultra-thin Co recording media
Author :
Gong, Heng ; Yang, Wei ; Lambeth, David N. ; Rao, Maithri ; Laughlin, David E.
Author_Institution :
Dept. of Electr. & Comput. Eng., Carnegie Mellon Univ., Pittsburgh, PA, USA
fDate :
7/1/1998 12:00:00 AM
Abstract :
Ultra-thin Co/Cr films were fabricated by RF diode sputtering. The highly exchange coupled Co grains were successfully isolated by post deposition processing. The microstructure was studied with TEM and a very small physical grain size was observed. The measurement of ΔM curves showed that the grain to grain interaction changed from positive to negative. Time dependent magnetic measurements showed significant thermal decay effects. It was also found that the use of CrMn underlayers instead of pure Cr further isolated the Co grains
Keywords :
cobalt; crystal microstructure; exchange interactions (electron); grain size; magnetic recording; magnetic thin films; sputtered coatings; thermal stability; transmission electron microscopy; Co; TEM; grain interaction; grain size; highly exchange coupled Co grains; microstructure; post deposition processing; thermal decay effects; thermal stability; ultra-thin Co recording media; Chromium; Diodes; Magnetic films; Magnetic recording; Micromagnetics; Microstructure; Radio frequency; Sputtering; Testing; Thermal stability;
Journal_Title :
Magnetics, IEEE Transactions on
