Title :
Read write characteristics of hexagonal barium ferrite sputtered films prepared by post deposition annealing
Author :
Morisako, Akimitsu ; Matsumoto, Mitsunori ; Naoe, Masahiko
Author_Institution :
Dept. of Inf. Eng., Shinshu Univ., Nagano, Japan
fDate :
7/1/1998 12:00:00 AM
Abstract :
Hexagonal barium ferrite (BaM) thin films were deposited onto crystallized glass, carbon, Si, SiO2/Si and quartz glass by a facing targets sputtering system and the read/write characteristic of BaM rigid disks were evaluated. The films were prepared at room temperature and crystallized in the air at 900°C for 100 sec. The coercivities of BaM films were in a range of 1.0 to 3 kOe and Ms is around 220 emu/cm. The recording density, Ds0, was in a range of 120 to 140 kfrpi by using MIG type head with the gap length of 0.2 μm at 0.6m/s, while Ds0 was 180 kfrpi by using an MR head at 1.0 m/s,
Keywords :
barium compounds; ferrites; magnetic recording; magnetic thin films; perpendicular magnetic recording; sputtered coatings; 0.2 mum; 100 s; 900 C; BaFe2O4; coercivities; hexagonal barium ferrite sputtered films; post deposition annealing; read write characteristics; read/write characteristics; recording density; rigid disks; Barium; Coercive force; Crystallization; Disk recording; Ferrite films; Glass; Magnetic heads; Semiconductor thin films; Sputtering; Temperature;
Journal_Title :
Magnetics, IEEE Transactions on
