DocumentCode
1414012
Title
Improvement of the Productivity in the THM Growth of CdTe Single Crystal as Nuclear Radiation Detector
Author
Shiraki, Hiroyuki ; Funaki, Minoru ; Ando, Yukio ; Kominami, Shinya ; Amemiya, Kensuke ; Ohno, Ryoichi
Author_Institution
Acrorad Co. Ltd., Uruma, Japan
Volume
57
Issue
1
fYear
2010
Firstpage
395
Lastpage
399
Abstract
The effect of the THM growth rate on the CdTe crystalline quality and the detector performance was intensively investigated. The maximum growth rate for the single crystal growth was found to be approximately 15 mm/day which was 3 times greater than the conventional one. By optimizing other growth conditions, 90% of every ingot volume has become a single crystal. Te inclusions in the CdTe single crystal grown at various growth rates were also investigated by IR transmission microscopy. There was no correlation between the behavior of Te inclusions and the growth rate. The detector performance was also independent of the growth rate. Taking advantage of the large volume CdTe single crystals, about 700 000 Schottky detectors with 4 mm à 7.5 mm à 1 mm were fabricated for the research and development of the new positron emission tomography (PET) system using CdTe detectors. The average FWHM for the 662 keV line from 137Cs and its standard deviation were 2.24% and 0.48%, respectively. This uniformity was essential for the development of the new PET system.
Keywords
III-VI semiconductors; cadmium compounds; crystal growth from melt; positron emission tomography; semiconductor counters; CdTe; CdTe crystalline quality; CdTe detector performance; CdTe single crystal THM growth; IR transmission microscopy; PET system; Schottky detectors; cadmium telluride single crystal; crystal growth rate; electron volt energy 662 keV; maximum growth rate; nuclear radiation detector; positron emission tomography; size 1 mm; size 4 mm; size 7.5 mm; tellurium inclusions; travelling heater method; Conductivity; Crystallization; Crystals; Electric resistance; Immune system; Positron emission tomography; Productivity; Radiation detectors; Tellurium; Temperature; CdTe characterization; CdTe growth; Gamma-Ray detectors; PET; THM; growth rate;
fLanguage
English
Journal_Title
Nuclear Science, IEEE Transactions on
Publisher
ieee
ISSN
0018-9499
Type
jour
DOI
10.1109/TNS.2009.2035316
Filename
5410012
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