DocumentCode :
1414012
Title :
Improvement of the Productivity in the THM Growth of CdTe Single Crystal as Nuclear Radiation Detector
Author :
Shiraki, Hiroyuki ; Funaki, Minoru ; Ando, Yukio ; Kominami, Shinya ; Amemiya, Kensuke ; Ohno, Ryoichi
Author_Institution :
Acrorad Co. Ltd., Uruma, Japan
Volume :
57
Issue :
1
fYear :
2010
Firstpage :
395
Lastpage :
399
Abstract :
The effect of the THM growth rate on the CdTe crystalline quality and the detector performance was intensively investigated. The maximum growth rate for the single crystal growth was found to be approximately 15 mm/day which was 3 times greater than the conventional one. By optimizing other growth conditions, 90% of every ingot volume has become a single crystal. Te inclusions in the CdTe single crystal grown at various growth rates were also investigated by IR transmission microscopy. There was no correlation between the behavior of Te inclusions and the growth rate. The detector performance was also independent of the growth rate. Taking advantage of the large volume CdTe single crystals, about 700 000 Schottky detectors with 4 mm × 7.5 mm × 1 mm were fabricated for the research and development of the new positron emission tomography (PET) system using CdTe detectors. The average FWHM for the 662 keV line from 137Cs and its standard deviation were 2.24% and 0.48%, respectively. This uniformity was essential for the development of the new PET system.
Keywords :
III-VI semiconductors; cadmium compounds; crystal growth from melt; positron emission tomography; semiconductor counters; CdTe; CdTe crystalline quality; CdTe detector performance; CdTe single crystal THM growth; IR transmission microscopy; PET system; Schottky detectors; cadmium telluride single crystal; crystal growth rate; electron volt energy 662 keV; maximum growth rate; nuclear radiation detector; positron emission tomography; size 1 mm; size 4 mm; size 7.5 mm; tellurium inclusions; travelling heater method; Conductivity; Crystallization; Crystals; Electric resistance; Immune system; Positron emission tomography; Productivity; Radiation detectors; Tellurium; Temperature; CdTe characterization; CdTe growth; Gamma-Ray detectors; PET; THM; growth rate;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/TNS.2009.2035316
Filename :
5410012
Link To Document :
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