• DocumentCode
    1414151
  • Title

    Analytic Derivation and Monte Carlo Validation of a Sensitivity Formula for Slit-Slit Collimation With Penetration

  • Author

    Ayan, Ahmet S. ; Metzler, Scott D. ; Accorsi, Roberto

  • Author_Institution
    Dept. of Radiol., Univ. of Pennsylvania, Philadelphia, PA, USA
  • Volume
    57
  • Issue
    1
  • fYear
    2010
  • Firstpage
    135
  • Lastpage
    143
  • Abstract
    A slit-slit collimator consists of two orthogonal slits and can be conceptualized as a generalized pinhole. Since the two slits are independent of each other, there can be independent axial and transaxial acceptance angles. A small axial acceptance angle may help mitigate axial blurring with circular orbits, allowing multiple copies axially. In addition, since the two slit planes can be placed at different distances with respect to the source, a better detector usage can be achieved, especially in the case of detectors and imaged objects with different aspect ratios. In this paper, an analytical expression is derived for the sensitivity of slit-slit collimation including effective slit widths for photon penetration. An analytical expression for sensitivity is necessary in order to accurately model the system response. This expression could also be useful for comparing a slit-slit´s sensitivity performance with others. When the effective slit width is used instead of the geometric slit width, the derived analytical expression accurately accounts for photon penetration of the aperture. The derived expression for the sensitivity was validated by Monte Carlo simulation for both geometric and penetrative cases.
  • Keywords
    Monte Carlo methods; collimators; single photon emission computed tomography; Monte Carlo simulation; SPECT; geometric slit width; photon penetration; slit widths; slit-slit collimation; slit-slit collimator; slit-slit sensitivity; Apertures; Attenuation; Collimators; Detectors; Image reconstruction; Monte Carlo methods; Object detection; Orbits; Radiology; Single photon emission computed tomography; Penetration; SPECT; sensitivity; skew-slit; slit-slit;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.2009.2030580
  • Filename
    5410032