DocumentCode
1414156
Title
Potential data loss due to head/disk contacts during dynamic load/unload
Author
Suk, Mike ; Jen, David
Author_Institution
Div. of Storage Syst., Int. Bus. Machines, San Jose, CA, USA
Volume
34
Issue
4
fYear
1998
fDate
7/1/1998 12:00:00 AM
Firstpage
1711
Lastpage
1713
Abstract
A functioning IBM drive was converted into a component load/unload tester in order to determine the consequence of full-speed loading and unloading of a slider on top of magnetic data. Tests using this apparatus show that the disk scratch damage produced by load/unload is necessary but not sufficient to result in defects that are detectable by surface analysis test. Comparison of the AFM of the scratch damage sites with the MFM of the surrounding data bits shows that data loss results from the physical damage and that any magnetostriction effect is negligible
Keywords
atomic force microscopy; hard discs; magnetic force microscopy; magnetic heads; wear; AFM; IBM drive; MFM; data loss; disk scratch damage; dynamic load/unload; head/disk contact; load/unload tester; magnetostriction; Actuators; Disk drives; Magnetic analysis; Magnetic force microscopy; Magnetic heads; Magnetic separation; Magnetoelasticity; Magnetostriction; Stress; System testing;
fLanguage
English
Journal_Title
Magnetics, IEEE Transactions on
Publisher
ieee
ISSN
0018-9464
Type
jour
DOI
10.1109/20.706680
Filename
706680
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