Title :
Evaluation on Protective Single Event Burnout Test Method for Power DMOSFETs
Author :
Liu, Sandra ; Marec, Ronan ; Sherman, Phillip ; Titus, Jeffrey L. ; Bezerra, Francoise ; Ferlet-Cavois, Véronique ; Marin, Marc ; Sukhaseum, Nicolas ; Widmer, Fabien ; Muschitiello, Michele ; Gouyet, Lionel ; Ecoffet, Robert ; Zafrani, Max
Author_Institution :
International Rectifier Corp., El Segundo, CA, USA
Abstract :
This paper evaluates protective single event burnout test method on power DMOSFETs to confirm that it provides accurate test results as the destructive test method when performed properly. The selection of resistor values, protective mechanism, and considerations in calculating SEB cross-section are discussed.
Keywords :
Power MOSFET; Resistors; Silver; Threshold voltage; Transient analysis; Xenon; Non-destructive; power MOSFET; single event burnout; test method;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.2011.2177863
