• DocumentCode
    1414797
  • Title

    Magnetization, magnetostriction and film stress of Fe monolayers on W(100)

  • Author

    Sander, D. ; Enders, A. ; Kirschner, J.

  • Author_Institution
    Max-Planck-Inst. fur Mikrostrukturphys., Halle, Germany
  • Volume
    34
  • Issue
    4
  • fYear
    1998
  • fDate
    7/1/1998 12:00:00 AM
  • Firstpage
    2015
  • Lastpage
    2017
  • Abstract
    Film stress, magnetization and magnetoelastic coupling are measured in situ by a simple optical deflection technique. This technique reveals that 2 nm thin Fe films grown on W(100) show magnetoelastic coupling that differs in both magnitude and sign from Fe bulk data. Stress contributions to the magnetoelastic coupling are discussed to describe this peculiar magnetoelastic behavior that is observed for Fe films thinner than 20 nm
  • Keywords
    bending; ferromagnetic materials; internal stresses; iron; magnetic epitaxial layers; magnetisation; magnetoelastic effects; magnetostriction; monolayers; 2 nm; Fe; Poisson ratio; W; W(100) substrate; Young´s modulus; cantilever bending; epitaxial misfit; film stress; in situ measurement; magnetization; magnetoelastic coupling; magnetostriction; optical deflection technique; thin Fe monolayers; ultrathin films; Couplings; Iron; Magnetic field induced strain; Magnetic films; Magnetization; Magnetostriction; Optical films; Strain measurement; Stress measurement; Substrates;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/20.706775
  • Filename
    706775