Title :
Quantized Conductance in
Conductive-Bridge Memory Cells
Author :
Jameson, John R. ; Gilbert, Nad ; Koushan, Foroozan ; Saenz, Juan ; Wang, Janet ; Hollmer, Shane ; Kozicki, Michael ; Derhacobian, Narbeh
Author_Institution :
Adesto Technol. Corp., Sunnyvale, CA, USA
Abstract :
Ag/GeS2/W conductive-bridge random access memory (CBRAM) cells are shown to program at room temperature to conductance levels near multiples of the fundamental conductance G0 = 2e2/h. This behavior is not accounted for in the traditional view that the conductance of a CBRAM cell is a continuous variable proportional to the maximum current allowed to flow during programming. For on -state resistances on the order of 1/G0 = 12.9 kΩ or less, quantization implies that the Ag “conductive bridge” typically contains a constriction, or even an extended chain, that can be as narrow as a single atom. Implications for device modeling and commercial applications are discussed.
Keywords :
electric admittance; random-access storage; CBRAM cell; conductance level; conductive bridge; conductive-bridge random access memory cell; continuous variable proportional; on-state resistance; programming; quantized conductance; Anodes; Cathodes; Histograms; Metals; Programming; Resistance; Wires; Conductive-bridge memory; conductive-bridge random access memory (CBRAM); germanium sulfide; nonvolatile memory; quantized conductance;
Journal_Title :
Electron Device Letters, IEEE
DOI :
10.1109/LED.2011.2177803