• DocumentCode
    1415052
  • Title

    A Modified Technique for Calibration of Current-Comparator-Based Capacitance Bridge and Its Verification

  • Author

    Faisal, Agah ; Jung, Jae Kap ; So, Eddy

  • Author_Institution
    Korea Res. Inst. of Stand. & Sci., Daejeon, South Korea
  • Volume
    60
  • Issue
    7
  • fYear
    2011
  • fDate
    7/1/2011 12:00:00 AM
  • Firstpage
    2642
  • Lastpage
    2647
  • Abstract
    A modified technique for calibrating both the capacitance-ratio and dissipation-factor (DF) dials of a current-comparator-based high-voltage capacitance bridge has been developed at the Korea Research Institute of Standards and Science (KRISS). The capacitance-ratio and DF dials are calibrated in the ratio range from 1/1 to 1000/1 and in the DF range from 10 × 10-6 to 1 × 10-1 for both positive and negative polarities. From the calculated and measured values of the corresponding dial balanced readings, the errors in the capacitance-ratio- and DF-dial readings are derived. The relative uncertainty of the modified calibration technique is also obtained to be not more than 10 × 10-6 of unity for the ratio-dial calibration, whereas the relative uncertainty of the DF dials from 1 × 10-3 to 1 × 10-1 is not more than 0.4% of the dial indication except the dissipation lower than 1 × 10-3 for which the corresponding absolute uncertainty is 5 × 10-6. The comparison results of the calibration performed at KRISS and the National Research Council of Canada show a good consistency with the measurement uncertainty.
  • Keywords
    calibration; capacitance measurement; current comparators; capacitance-ratio; current-comparator-based capacitance bridge; dissipation-factor dials; Calibration; Capacitance; Capacitors; Current measurement; Resistors; Uncertainty; Windings; Calibration; current-comparator-based high-voltage capacitance bridge (CCB-HVCB); dissipation factor (DF); ratio; uncertainty;
  • fLanguage
    English
  • Journal_Title
    Instrumentation and Measurement, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9456
  • Type

    jour

  • DOI
    10.1109/TIM.2010.2096952
  • Filename
    5677471