DocumentCode :
1415146
Title :
Direct measurement of the noise appearing in the base circuit of a bipolar transistor
Author :
Knott, K.F.
Author_Institution :
University of Salford, Department of Electrical Engineering, Salford, UK
Volume :
115
Issue :
7
fYear :
1968
fDate :
7/1/1968 12:00:00 AM
Firstpage :
903
Lastpage :
905
Abstract :
Direct measurements have been made, at 1 kHz, of the noise appearing in the base circuit of a bipolar transistor. These measurements were made to test the validity of a simple approach to the circuit analysis of the noise in bipolar transistors in which the noise-current generator is assumed to be a real generator associated with shot noise on the base current. Results show that the noise-current generator present in the base circuit has a value very close to that predicted by the simple theory.
fLanguage :
English
Journal_Title :
Electrical Engineers, Proceedings of the Institution of
Publisher :
iet
ISSN :
0020-3270
Type :
jour
DOI :
10.1049/piee.1968.0165
Filename :
5248236
Link To Document :
بازگشت