• DocumentCode
    1415148
  • Title

    Contributions of \\hbox {N}^{+} , \\hbox {N}_{2}^{+} ,

  • Author

    Li, Zebin ; Liang, Rongqing ; Ou, Qiongrong ; Zhang, Shuyu ; He, Long ; Chang, Xijiang ; Wu, Xiaojing ; Wu, Zhonghang ; He, Zhijiang ; Gao, Huanzhong

  • Author_Institution
    Dept. of Illuminating Eng. & Light Sources, Fudan Univ., Shanghai, China
  • Volume
    39
  • Issue
    2
  • fYear
    2011
  • Firstpage
    711
  • Lastpage
    716
  • Abstract
    Different nitrogen sources, pure N2, pure NO, and NO mixed with O2 (25% NO + 75% O2), are used to confirm the effects of N+, N2+, and NO+ ion implantation on the p-type conversion of ZnO:Al (AZO) films by plasma-immersion ion implantation (PIII) based on N-Al codoping mechanism. For the plasma of N2, NO, and NO mixed with O2, the major implanted ions are, respectively, N2+ ions, N2+ mixed with NO+ ions, as well as N+ mixed with O+ ions, confirmed by the optical emission spectra of plasma. After activation by postimplanted annealing, the photoluminescence and X-ray photoelectron spectroscopy analyses indicate that the implanted N+, N2+, and NO+ ions replace the O sites and form nitrogen atom substitutions at O sites [(NO)], nitrogen molecule substitutions at O sites [(N2)O], as well as zinc nitrite and zinc nitrate, respectively. Among all the N-induced defects, only NO contribute to the p-type conversion of ZnO films. That explains why p-type conversion is only successfully achieved by NO mixed with O2, while others still remain n-type conductivity. The mechanism of p-type conversion by N2, NO, and NO mixed O2 PIII was investigated in this paper.
  • Keywords
    II-VI semiconductors; X-ray photoelectron spectra; aluminium; annealing; nitrogen; nitrogen compounds; photoluminescence; plasma immersion ion implantation; semiconductor doping; semiconductor growth; semiconductor thin films; wide band gap semiconductors; zinc compounds; X-ray photoelectron spectroscopy; ZnO:Al,N; ZnO:Al,N2; ZnO:Al,NO; codoping mechanism; n-type conductivity; nitrogen atom substitutions; optical emission spectra; p-type conversion; photoluminescence; plasma-immersion ion implantation; post-implanted annealing; thin films; N–Al codoping; p-type ZnO; plasma immersion ion implantation (PIII);
  • fLanguage
    English
  • Journal_Title
    Plasma Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0093-3813
  • Type

    jour

  • DOI
    10.1109/TPS.2010.2093541
  • Filename
    5677485