• DocumentCode
    1415432
  • Title

    A Variational Bayesian Framework for Clustering with Multiple Graphs

  • Author

    Shiga, Motoki ; Mamitsuka, Hiroshi

  • Author_Institution
    Bioinf. Center, Kyoto Univ., Uji, Japan
  • Volume
    24
  • Issue
    4
  • fYear
    2012
  • fDate
    4/1/2012 12:00:00 AM
  • Firstpage
    577
  • Lastpage
    590
  • Abstract
    Mining patterns in graphs has become an important issue in real applications, such as bioinformatics and web mining. We address a graph clustering problem where a cluster is a set of densely connected nodes, under a practical setting that 1) the input is multiple graphs which share a set of nodes but have different edges and 2) a true cluster cannot be found in all given graphs. For this problem, we propose a probabilistic generative model and a robust learning scheme based on variational Bayesian estimation. A key feature of our probabilistic framework is that not only nodes but also given graphs can be clustered at the same time, allowing our model to capture clusters found in only part of all given graphs. We empirically evaluated the effectiveness of the proposed framework on not only a variety of synthetic graphs but also real gene networks, demonstrating that our proposed approach can improve the clustering performance of competing methods in both synthetic and real data.
  • Keywords
    belief networks; data mining; graph theory; learning (artificial intelligence); pattern clustering; probability; variational techniques; clustering performance; graph clustering; pattern mining; probabilistic framework; probabilistic generative model; real gene network; robust learning scheme; synthetic graph; variational Bayesian estimation; variational Bayesian framework; Bayesian methods; Clustering algorithms; Joints; Probabilistic logic; Robustness; Stochastic processes; Symmetric matrices; Clustering; graphs; localized clusters.; statistical machine learning; variational Bayesian learning;
  • fLanguage
    English
  • Journal_Title
    Knowledge and Data Engineering, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1041-4347
  • Type

    jour

  • DOI
    10.1109/TKDE.2010.272
  • Filename
    5677533