Title :
SEU Tolerant Latch Based on Error Detection
Author :
She, Xiaoxuan ; Li, N. ; Tong, J.
Author_Institution :
State Key Lab. of ASIC & Syst., Fudan Univ., Shanghai, China
Abstract :
This paper presents an SEU hardened latch that can mitigate SEU based on an error detection circuit and a multiplexer. During the hold phase, an SEU on an internal node may upset the logic state of the latch. But the error detection circuit can detect this fault and generate fault indication signals via precharge and discharge operations. The fault indication signals control a multiplexer to select a correct output. Therefore, each latch has some error detection and correction capability.
Keywords :
error correction; error detection; fault diagnosis; flip-flops; logic circuits; multiplexing equipment; SEU hardened latch; SEU tolerant latch; discharge operations; error correction; error detection circuit; fault indication signals; logic state; multiplexer; precharge operation; Circuit faults; Clocks; Delay; Latches; Single event upset; Tunneling magnetoresistance; Very large scale integration; Hardened by design; latch; radiation effects; single event upset (SEU);
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.2011.2178265