DocumentCode :
1415769
Title :
High performance low noise charge preamplifier with DC coupling to particle silicon detectors in CMOS technology
Author :
Hu, Y.
Author_Institution :
LEPSI, Univ. Louis Pasteur, Strasbourg, France
Volume :
34
Issue :
13
fYear :
1998
fDate :
6/25/1998 12:00:00 AM
Firstpage :
1274
Lastpage :
1275
Abstract :
A low noise, low power CMOS charge preamplifier with DC coupling to particle silicon detectors has been designed. Simulation results show that the detector leakage current can be compensated up to 8 μA. The proposed charge amplifier has been simulated and implemented with a CMOS silicon-on-insulator process. A total RMS output noise voltage of 0.58 mV for a detector capacitance of 10 pF and a DC leakage current of 5 μA and a conversion gain of 2.86 mV/fC with 0.66 mW power consumption have been obtained
Keywords :
CMOS analogue integrated circuits; leakage currents; preamplifiers; silicon radiation detectors; silicon-on-insulator; 0.58 mV; 0.66 mW; 10 pF; 5 muA; CMOS technology; DC coupling; DC leakage current; RMS output noise voltage; charge preamplifier; conversion gain; detector capacitance; detector leakage current; particle silicon detectors; power consumption; silicon-on-insulator process;
fLanguage :
English
Journal_Title :
Electronics Letters
Publisher :
iet
ISSN :
0013-5194
Type :
jour
DOI :
10.1049/el:19981698
Filename :
707180
Link To Document :
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