DocumentCode :
1415804
Title :
Reusing and Retargeting On-Chip Instrument Access Procedures in IEEE P1687
Author :
Zadegan, Farrokh Ghani ; Ingelsson, Urban ; Larsson, Erik ; Carlsson, Gunnar
Author_Institution :
Linkoping Univ., Linkoping, Sweden
Volume :
29
Issue :
2
fYear :
2012
fDate :
4/1/2012 12:00:00 AM
Firstpage :
79
Lastpage :
88
Abstract :
This paper discusses the reuse and retargeting of test instruments and test patterns using the IEEE P1687 standard in an era where reuse of existing functional elements and integration of IP blocks is accelerating rapidly. It briefly discusses the deficiencies of existing 1149.1 (JTAG) and 1500 standards and demonstrates how the new standard, P1687, plugs these exposures by specifying JTAG as an off-chip to on-chip interface to the instrument access infrastructure. It provides a simple example to underscore the need for the standard and then builds on this example to show how the standard can be used for more complex situations.
Keywords :
IEEE standards; integrated circuit testing; logic circuits; microprocessor chips; 1149.1 standard; 1500 standard; IEEE P1687 standard; IP block integration; JTAG standard; functional element; off-chip-on-chip interface; on-chip instrument access procedures; test instrument; test pattern; IEEE standards; Instruments; Shift registers; System-on-a-chip; Temperature sensors; ICL; IEEE P1687; PDL; access procedures; on-chip instruments; reuse and retargeting;
fLanguage :
English
Journal_Title :
Design & Test of Computers, IEEE
Publisher :
ieee
ISSN :
0740-7475
Type :
jour
DOI :
10.1109/MDT.2012.2182984
Filename :
6123193
Link To Document :
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