DocumentCode :
1416022
Title :
Multiple-valued logic application of a triple well resonant tunneling diode
Author :
Kusano, C. ; Tanoue, Takuya ; Mizuta, Hiroshi ; Takahashi, Satoshi
Author_Institution :
Hitachi Ltd., Tokyo
Volume :
35
Issue :
12
fYear :
1988
fDate :
12/1/1988 12:00:00 AM
Firstpage :
2453
Abstract :
A novel resonant tunneling diode (RTD) with four potential barriers and three quantum wells has been proposed and applied to multiple-valued logic devices. This is the first report of a single diode exhibiting significant double negative differential resistance (NDR) characteristics and operating as a triply stable device with a single supply voltage. The structure of the device is described. It showed significant double NDR between 180 K and room temperature, exhibiting the best characteristics at 219 K; peak/valley current ratios were 2.8 and 1.4 with the same peak currents of 4×102 A/cm2 for both NDR peaks. With load resistance of 100 Ω and applied voltage of 1 V, this diode exhibited three stable states at 0.066, 0.158, and 0.249 V, in excellent agreement with numerically simulated values. The numerical simulation also showed that the two resonance voltages can be adjusted independently by varying the width of the wells. This triple-well RTD can realize triple-valued logic devices with a single supply voltage
Keywords :
many-valued logics; tunnel diodes; 1 V; 100 ohm; 158 mV; 180 to 300 K; 249 mV; 66 mV; NDR; NDR peaks; RTD; double NDR; double negative differential resistance; four potential barriers; load resistance; multiple-valued logic devices; numerical simulation; peak currents; peak/valley current ratios; single supply voltage; structure; three quantum wells; triple well resonant tunneling diode; triple-valued logic devices; triple-well RTD; triply stable device; voltage adjustment; Capacitance; Current measurement; Diodes; Electrons; Gallium arsenide; Indium gallium arsenide; Logic; Resonant tunneling devices; Temperature; Voltage;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/16.8889
Filename :
8889
Link To Document :
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